Rogowski current probe designed for measuring very high-amplitude AC currents up to 120 A, offering a wide bandwidth from 14 Hz to 25 MHz and a sensitivity of 50 mV/A. Its near-zero impedance enables accurate measurements without affecting the circuit under test, which is useful in analyzing fast waveforms and power systems (MOSFETs, IGBTs, SiC, GaN). Micsig RCP120M-200

Rogowski current probe designed for measuring very high-amplitude alternating currents up to 12,000 A, offering a wide bandwidth from 2 Hz to 10 MHz and a sensitivity of 0.5 mV/A. Its near-zero impedance enables accurate measurements without affecting the circuit under test, which is useful in analyzing fast waveforms and power systems (MOSFETs, IGBTs, SiC, GaN). Micsig RCP12000L-700

Rogowski current probe designed for measuring very high-amplitude alternating currents up to 6000 A, offering a wide bandwidth from 3 Hz to 10 MHz and a sensitivity of 1 mV/A. Its near-zero impedance enables accurate measurements without affecting the circuit being tested, which is useful in analyzing fast waveforms and power systems (MOSFETs, IGBTs, SiC, GaN). Micsig RCP6000L-700

Rogowski current probe designed for measuring very high-amplitude alternating currents up to 3000 A, offering a wide bandwidth from 4 Hz to 10 MHz and a sensitivity of 2 mV/A. Its near-zero impedance enables accurate measurements without affecting the circuit being tested, which is useful in analyzing fast waveforms and power systems (MOSFETs, IGBTs, SiC, GaN). Micsig RCP3000L-700

Rogowski current probe designed for measuring very high-amplitude alternating currents up to 1200 A, offering a wide bandwidth from 5 Hz to 10 MHz and a sensitivity of 5 mV/A. Its near-zero impedance enables accurate measurements without affecting the circuit under test, which is useful in analyzing fast waveforms and power systems (MOSFETs, IGBTs, SiC, GaN). Micsig RCP1200L-700

Rogowski current probe designed for measuring very high-amplitude alternating currents up to 600 A, offering a wide bandwidth from 8 Hz to 10 MHz and a sensitivity of 10 mV/A. Its near-zero impedance enables accurate measurements without affecting the circuit being tested, which is useful in analyzing fast waveforms and power systems (MOSFETs, IGBTs, SiC, GaN). Micsig RCP600L-700

Rogowski current probe designed for measuring very high-amplitude alternating currents up to 12,000 A, offering a wide bandwidth from 2 Hz to 10 MHz and a sensitivity of 0.5 mV/A. Its near-zero impedance enables accurate measurements without affecting the circuit under test, which is useful in analyzing fast waveforms and power systems (MOSFETs, IGBTs, SiC, GaN). Micsig RCP12000M-700

Rogowski current probe designed for measuring very high-amplitude alternating currents up to 6000 A, offering a wide bandwidth from 3 Hz to 10 MHz and a sensitivity of 1 mV/A. Its near-zero impedance enables accurate measurements without affecting the circuit being tested, which is useful in analyzing fast waveforms and power systems (MOSFETs, IGBTs, SiC, GaN). Micsig RCP6000M-700

Rogowski current probe designed for measuring very high-amplitude alternating currents up to 6000 A, offering a wide bandwidth from 2 Hz to 25 MHz and a sensitivity of 1 mV/A. Its near-zero impedance enables accurate measurements without affecting the circuit being tested, which is useful in analyzing fast waveforms and power systems (MOSFETs, IGBTs, SiC, GaN). Micsig RCP6000M-200

Rogowski current probe designed for measuring very high-amplitude alternating currents up to 3000 A, offering a wide bandwidth from 3 Hz to 25 MHz and a sensitivity of 2 mV/A. Its near-zero impedance enables accurate measurements without affecting the circuit being tested, which is useful in analyzing fast waveforms and power systems (MOSFETs, IGBTs, SiC, GaN). Micsig RCP3000M-200

Rogowski current probe designed for measuring very high-amplitude alternating currents up to 1200 A, offering a wide bandwidth from 5 Hz to 25 MHz and a sensitivity of 5 mV/A. Its near-zero impedance enables accurate measurements without affecting the circuit under test, which is useful in analyzing fast waveforms and power systems (MOSFETs, IGBTs, SiC, GaN). Micsig RCP1200M-200

Rogowski current probe designed for measuring very high-amplitude alternating currents up to 600 A, offering a wide bandwidth from 5 Hz to 25 MHz and a sensitivity of 10 mV/A. Its near-zero impedance enables accurate measurements without affecting the circuit being tested, which is useful in analyzing fast waveforms and power systems (MOSFETs, IGBTs, SiC, GaN). Micsig RCP600M-200

Rogowski current probe designed for measuring very high-amplitude alternating currents up to 300 A, offering a wide bandwidth from 7 Hz to 25 MHz and a sensitivity of 20 mV/A. Its near-zero impedance enables accurate measurements without affecting the circuit being tested, which is useful in analyzing fast waveforms and power systems (MOSFETs, IGBTs, SiC, GaN). Micsig RCP300M-200

Rogowski current probe designed for measuring very high-amplitude alternating currents up to 6000 A, offering a wide bandwidth from 3 Hz to 10 MHz and a sensitivity of 1 mV/A. Its near-zero impedance enables accurate measurements without affecting the circuit being tested, which is useful in analyzing fast waveforms and power systems (MOSFETs, IGBTs, SiC, GaN). Micsig RCP6000S-700

Rogowski current probe designed for measuring high-amplitude AC currents up to 3000 A, offering a wide bandwidth from 4 Hz to 30 MHz and a sensitivity of 2 mV/A. Its near-zero impedance enables accurate measurements without affecting the circuit under test, which is useful in analyzing fast waveforms and power systems (MOSFETs, IGBTs, SiC, GaN). Micsig RCP3000XS-80

Rogowski current probe designed for measuring very high-amplitude alternating currents up to 6000 A, offering a wide bandwidth from 2 Hz to 25 MHz and a sensitivity of 1 mV/A. Its near-zero impedance enables accurate measurements without affecting the circuit under test, which is useful in analyzing fast waveforms and power systems (MOSFETs, IGBTs, SiC, GaN). Micsig RCP6000S-200

Rogowski current probe designed for measuring very high-amplitude alternating currents up to 3000 A, offering a wide bandwidth from 3 Hz to 25 MHz and a sensitivity of 2 mV/A. Its near-zero impedance enables accurate measurements without affecting the circuit under test, which is useful in analyzing fast waveforms and power systems (MOSFETs, IGBTs, SiC, GaN). Micsig RCP3000S-200

Rogowski current probe designed for measuring very high-amplitude alternating currents up to 1200 A, offering a wide bandwidth from 5 Hz to 25 MHz and a sensitivity of 5 mV/A. Its near-zero impedance enables accurate measurements without affecting the circuit under test, which is useful in analyzing fast waveforms and power systems (MOSFETs, IGBTs, SiC, GaN). Micsig RCP1200S-200

Rogowski current probe designed for measuring very high amplitude alternating currents up to 600 A, offering a wide bandwidth from 5 Hz to 25 MHz and a sensitivity of 10 mV/A. Its near-zero impedance enables accurate measurements without affecting the circuit being tested, which is useful in the analysis of fast waveforms and power systems (MOSFETs, IGBTs, SiC, GaN). Micsig RCP600S-200

Rogowski current probe designed for measuring very high-amplitude alternating currents up to 300 A, offering a wide bandwidth from 7 Hz to 25 MHz and a sensitivity of 20 mV/A. Its near-zero impedance enables accurate measurements without affecting the circuit being tested, which is useful in analyzing fast waveforms and power systems (MOSFETs, IGBTs, SiC, GaN). Micsig RCP300S-200