• Obecnie brak na stanie
Advances in Imaging and Electron Physics
search
  • Advances in Imaging and Electron Physics
ID: 170323
Peter Hawkes
Wycofany
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.  This particular volume presents several timely articles on the scanning transmission electron microscope.

  • Updated with contributions from leading international scholars and industry experts

  • Discusses hot topic areas and presents current and future research trends

  • Provides an invaluable reference and guide for physicists, engineers and mathematicians



    • Albert V. Crewe, The beginnings and development of the scanning transmission electron microscope (STEM)


    Andreas Engel, STEM in the life sciences


    Peter Hawkes, The AEI and Siemens STEM instruments


    Hiromi Inada, STEM in Japan


    Michael S. Isaacson, Early work on the STEM


    Bernard Jouffrey, The Toulouse high-voltage STEM project


    Ondrej Krivanek, Aberration-corrected STEM


    K.C.A. Smith, STEM in Cambridge


    Lyn Swanson and Greg Schwind, A review of the cold field electron cathode


    Sebastian von Harrach, STEM in Oxford and at Vacuum Generators


    Ian Wardell and Peter Bovey, The Vacuum Generators STEM


    Joseph Wall, Historical background of the STEM at Brookhaven National Laboratory

    170323

    Produkty z tej samej kategorii (16)