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Advances in Imaging and Electron Physics
ID: 170323
Peter Hawkes
Advances in Imaging and Electron Physics merges two long-running serials. Advances in Electronics and Electron. Physics and Advances in Optical and Electron Microscopy . This series features extended, low-energy devices, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods in all these domains . This particular volume presents some timely articles on the scanning transmission electron microscope.
Updated with contributions from the international leading scholars and industry experts
Discusses hot topic areas and present and future research trends
Provides an invaluable reference and guide for physicists, engineers and mathematicians
Albert V. Crewe, The beginnings and development of the scanning transmission electron microscope (STEM)
Andreas Engel, STEM in the life sciences
Peter Hawkes , The AEI and Siemens STEM instruments
Hiromi Inada, STEM in Japan
Michael S. Isaacson, Early work on the STEM
Bernard Jouffrey, The Toulouse high-voltage STEM project
Ondrej Krivanek, Aberration-corrected STEM
KCA Smith, STEM in Cambridge
Lyn Swanson and Greg Schwind, A review of the cold field electron cathode
Sebastian von Harrach, STEM in Oxford and at Vacuum Generators
Ian Wardell and Peter Bovey, The Vacuum Generators STEM
Joseph Wall, Historical background of the STEM at Brookhaven National Laboratory
170323
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