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About the book
The subject of the monograph concerns the diagnostics of industrial processes, carried out in real time in an automatic manner by a computer system. The task of diagnostics of industrial processes is early detection and location of failures of components of technological installation, measuring devices, executive devices and other destructive events. They cause significant and long-lasting disruptions in the production process, reducing its efficiency, and sometimes lead to a stoppage of the process. Economic losses in such cases are very large. Some emergency conditions can lead to environmental contamination or destruction of the production installation, and can also threaten people's lives. Computer implementation of diagnostic activities during the process operation brings about a significant improvement in system security as well as increased economic effects. At the same time, thanks to accurate and fast diagnostic information, it is possible to automatically perform appropriate safeguards, allowing to avoid or limit the effects of damage before dangerous consequences occur in the course of the technological process. This results in a damage tolerant effect. The aim of the work is to present the methods of detection and location of damage to dynamic objects and exemplary applications of these methods. Presented are current diagnosis algorithms useful for applications in computer control systems and monitoring of industrial processes, as well as diagnostic systems. Issues discussed are on the borderline of many areas, especially automation, IT and technical diagnostics. Diagnostic algorithms use modeling and identification methods developed in the field of automation as well as artificial intelligence techniques: neural networks, fuzzy and approximate logic, and expert systems. Typical diagnostic objects are installations in the chemical, petrochemical, energy, metallurgy, pharmaceutical, food, paper and other industries. These methods are also used in the diagnosis of rockets, aircraft, gas networks, oil pipelines, pumps, engines, etc. The presented methodology of detection and location of damage is useful in the diagnosis of various processes: thermal, chemical, mass, energy, location, etc. and various types devices: mechanical, electrical, hydraulic, pneumatic. The book may therefore be of interest to specialists in many fields of technology. It can also be used by students and PhD students of such majors as: Automation and Robotics, Computer Science and Operation and Construction of Machines, where problems of diagnostics and process safety are increasingly being lectured.
Stand-alone debugging and programming mini probe for STM32 microcontrollers with JTAG/SWD interfaces. STMicroelectronics STLINK-V3 MINI
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Spacer sleeve with internal diameter 3.2mm and external diameter 5mm, sleeve length 8mm. The sleeve is made of white polyamide, Fix & Fasten, RoHS
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AVT kit for self-assembly of energy-saving optical siren with LED diodes. AVT790 B
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AVT kit for self-assembly of the Lock code lock. AVT5601 B
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