- Out-of-Stock
Advances in Imaging and Electron Physics
ID: 170298
Peter Hawkes
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron. Physics and Advances in Optical and Electron Microscopy. This series features extended, low-energy devices, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods in all these domains .
Chapter 1 - PULS and CHA;
Chapter 2 - Phase problem and reference beam diffraction (SHEN);
Chapter 3 - Fractal encoding (VITULANO)
Chapter 4 - Morphologically debiassed classifier fusion: A tomography-theoretic approach (WINDRIDGE)
Chapter 1 - PULS and CHA;
Chapter 2 - Phase problem and reference beam diffraction (SHEN);
Chapter 3 - Fractal encoding (VITULANO)
Chapter 4 - Morphologically debiassed classifier fusion: A tomography-theoretic approach (WINDRIDGE)
170298
Other products in the same category (16)
Jacek Nowak, Wiesław Winiecki, Sławomir Stanik
Delivery date unknown
No product available!
No product available!
No product available!
No product available!
No product available!
group work
Delivery date unknown
No product available!
Stanisław Bolkowski, Wiesław Brociek, Henryk Rawa
Delivery date unknown
No product available!
Winkler Wilibald, Wiszniewski Andrzej
Delivery date unknown
No product available!
No product available!
No product available!
No product available!
No product available!
No product available!
No product available!
No product available!
Schmid Dietmar (ed.)
Delivery date unknown
No product available!
Peter Hawkes