Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron. Physics and Advances in Optical and Electron Microscopy. This series features extended, low-energy devices, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods in all these domains .

Chapter 1 - PULS and CHA;

Chapter 2 - Phase problem and reference beam diffraction (SHEN);

Chapter 3 - Fractal encoding (VITULANO)

Chapter 4 - Morphologically debiassed classifier fusion: A tomography-theoretic approach (WINDRIDGE)