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Advances in Imaging and Electron Physics
ID: 170328
Peter Hawkes
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Advances in Imaging and Electron Physics merges two long-running serials. Advances in Electronics and Electron. Physics and Advances in Optical and Electron Microscopy .
This series features extended, low-energy devices, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods in all these domains .
* Contributions from leading international scholars and industry experts
* Discusses hot topic areas and present and future research trends
* Invaluable reference and guide for physicists, engineers and mathematicians
This series features extended, low-energy devices, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods in all these domains .
* Contributions from leading international scholars and industry experts
* Discusses hot topic areas and present and future research trends
* Invaluable reference and guide for physicists, engineers and mathematicians
- Identification Of Historical Pigments In Wall Layers By Combination Of Optical And Scanning Electron Microscopes Coupled To Energy Dispersive Spectroscopy - A. Sever Skapin
- Optical interference near surfaces and its application in sub-wavelength microscopy - WS Bacsa
- Introduction of a Quantum of Time (\ chronon "), and its Consequences for the Electron in Quantum and Classical Physics - Ruy H. A Farias and Erasmus RECAMI
- Superresolution Imaging - Revisited - Markus E. Testorf
- Methods and Limitations of Subwavelength Imaging Andrew Neice
170328
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Peter Hawkes