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Dictionary of diagnostic methods of analog electronic circuits
Jerzy Rutkowski
Free shipping
free shipping in Poland for all orders over 500 PLN
Same day shipping
If your payment will be credited to our account by 11:00
14 days for return
Each consumer can return the purchased goods within 14 days
Author: Jerzy Rutkowski ISBN: 83-206-1484-8 Format: B5, 176 pages Publisher: WKiŁ |
About the book |
The high demands placed on mass-produced and widely used electronic systems make quality control take on special significance. Effective and verified in practice test methods of analogue electronic circuits are so-called predictive methods in which a failure dictionary is constructed at the pre-test stage. At the testing stage, the measurement data, after processing, are compared with the signatures, which allows to detect the damage and possibly locate it. The book describes just such testing methods. They use the latest tools and computing techniques, such as neural networks, evolutionary techniques or fuzzy sets, and can be easily adapted to the diagnosis of non-electronic analog circuits. The monograph on the character of the manual describes the basics of testing and diagnostics of analogue electronic circuits as well as an overview of all practically used methods and techniques used in diagnosis based on a dictionary. At the end an assessment was made summarizing the diagnostic methods, indicating the advantages and disadvantages and assessing the suitability of individual methods to detect various types of damage. Recipients: engineers, designers and users of analog integrated circuits, as well as students of electronics faculties of technical universities and PhD students in the field of electronics. The book was published as a joint venture of the Faculty of Automatic Control, Electronics and Computer Science of the Silesian University of Technology and Publications of Communications and Communications. Table of Contents: List of important designations and abbreviations Introductory information Introduction to the problems of testing analogue electronic systems 2.1. Systematics of testing 2.2. Classification and sources of damage 2.3. Area of tolerance, efficiency area and other definitions 2.4. Classification of methods using damage testing 2.5. Summary Testing using pre-test simulation 3.1. A general description of the dictionary approach 3.2. An integer code reference dictionary - general concept 3.3. Optimization of the selection of test points The use of sensitivity analysis to the construction of a dictionary of signatures 4.1. Basics of sensitivity analysis 4.2. Mapping the tolerance area from the parameter space to the measurement space and determining the sets of ambiguities 4.3. Optimization of test points and determination of signatures Neuron dictionary of lesions 5.1. The use of a neural network for the classification of lesions The use of the concept of fuzzy sets to the construction of a fault dictionary 6.1. Basics of fuzzy sets theory 6.2. Blurry dictionary of defects 6.3. Fuzzy dictionary using a neural classifier The use of evolutionary computational techniques in the diagnosis of analog damage 7.1. Introduction to the problems of evolutionary computational techniques 7.2. The use of a genetic algorithm to optimize test points 7.3. Damage dictionary using genetic programming 7.4. The use of evolutionary strategy to optimize dynamic testing Damage dictionary using the concept of immutability of the sensitivity sequence Summary Literature Index |
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