Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron. Physics and Advances in Optical and Electron Microscopy. This series features extended, low-energy devices, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods in all these domains .

- Discusses Spectral Color Spaces
- Covers Phase Contrast Enhancement with Phase Plates in Electron Microscopy
- Studies the Optical Properties of Gas Phase Field Ionization Sources
- Looks at Symmetric and Nonsymmetric Divergence Measures and Their Generalizations
- Describes the features and the future of the International System of Units (SI)
- Illustrates Importance Sampling Hough Transform

Chapter 1 - Spectral Color Spaces: Their Structure and Transformations (LENZ);

Chapter 2 - Phase Contrast Enhancement with Phase Plates in Electron Microscopy (NAGAYAMA);

Chapter 3 - A Study of Optical Properties of Gas Phase Field Ionization Sources (LIU and Orloff);

Chapter 4 - On Symmetric and Nonsymmetric Divergence Measures and Their Generalizations (TANA);

Chapter 5 - Features and Future of the International System of Units (SI) (VALDES);

Chapter 6 - The Importance Sampling Hough Transform (WALSH)