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The Zeenko near-field probe set based on a 4-layer PCB enables precise detection of EMI sources in electronic circuits. When used with spectrum analyzers such as tinySA ULTRA, it provides effective electromagnetic diagnostics without the need for external amplifiers. An ideal solution for analyzing and eliminating interference in electronic systems.
The Zeenko near-field probe set is designed for detecting electromagnetic interference (EMI). The set includes two magnetic field (H-Field) probes with diameters of 28 mm and 4.5 mm, as well as one electric field (E-Field) probe. The probes are made using 4-layer PCB (FR-4) technology with stripline routing in the inner layer and shielding via copper outer layers, which significantly improves suppression of unwanted coupling compared to 2-layer designs.
In practice, the large H-Field probe is used for coarse localization of the interference source, while the smaller one allows precise narrowing of the area and identifying the exact point of magnetic emission. When used with spectrum analyzers such as the tinySA ULTRA, the probes enable effective and efficient EMI source localization and diagnostics.
Manufacturer BTC Korporacja sp. z o. o. Lwowska 5 05-120 Legionowo Poland sprzedaz@kamami.pl 22 767 36 20
Responsible person BTC Korporacja sp. z o. o. Lwowska 5 05-120 Legionowo Poland sprzedaz@kamami.pl 22 767 36 20
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The Zeenko near-field probe set based on a 4-layer PCB enables precise detection of EMI sources in electronic circuits. When used with spectrum analyzers such as tinySA ULTRA, it provides effective electromagnetic diagnostics without the need for external amplifiers. An ideal solution for analyzing and eliminating interference in electronic systems.