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Waveguide Spectroscopy of Thin Films
ID: 175917
Alexander Khomchenko
In this book a new concept of nonlinear optical properties of thin films are presented. Fourier spectroscopy spectroscopy of the light beam in the thin-film structures. Measurement of the absorption, refractive index and thickness of the dielectric, semiconductor or metallic films are considered.
This book is highly recommended for students in the fields of integrated film.
· There are new techniques of measurement of thin-film parameters stated
Foreword
acknowledgments
Contents
Introduction
1. Interaction of light with matter
2. Spectroscopy of optical guided modes
3. New applications of the m-line technique for thin-film structure
4. Spatial Fourier spectroscopy of guided modes: measuring the thin-film parameters
5. Characterizations of thin films by prism
6. Measurements of absorption spectra of thin films
7. Applications of waveguide spectroscopy techniques in sensor systems
8. Optical nonlinearity in thin films at low-intensity light
9. Optical nonlinearity in multilayer structures
Bibliography
index
This book is highly recommended for students in the fields of integrated film.
· There are new techniques of measurement of thin-film parameters stated
Foreword
acknowledgments
Contents
Introduction
1. Interaction of light with matter
2. Spectroscopy of optical guided modes
3. New applications of the m-line technique for thin-film structure
4. Spatial Fourier spectroscopy of guided modes: measuring the thin-film parameters
5. Characterizations of thin films by prism
6. Measurements of absorption spectra of thin films
7. Applications of waveguide spectroscopy techniques in sensor systems
8. Optical nonlinearity in thin films at low-intensity light
9. Optical nonlinearity in multilayer structures
Bibliography
index
175917
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