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Tadeusz Więckowski
The book presents the problems related to the electromagnetic compatibility testing of electrical and electronic devices, and thus to the testing of emissivity and sensitivity.
Particular attention was paid to the methods of simulation of contractual test signals used in testing the sensitivity of devices to electromagnetic disturbances.
The research methods simulating both direct and indirect influence of the electromagnetic field on the devices are presented. In addition to the analysis of the methods of testing the sensitivity of devices to electromagnetic fields, examples of practical implementation of simulators and measurement stations used in tests are also shown.
The subject of the monograph has not been limited to issues related to sensitivity to electromagnetic fields, also issues related to the emission of disturbances to the environment, both by radiation and conduction.
Table of Contents
List of important markings.
1. Introduction
2. Electromagnetic environment
3. The influence of electromagnetic disturbances on devices
4. Methods of testing the sensitivity of devices to electromagnetic disturbances
5. Research on the sensitivity of devices to electromagnetic disturbances
6. Measurement of conducted disorders
7. Measurement of radiated disorders
8. Alternative methods for measuring field radiation
9. Final notes
10.Literatura.
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Thermal imaging camera with a 2.4" LCD display. It measures the temperature in the range from -10 to 400°C. Uni-T UTi80P
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Module with the LoRaWAN ASR6501 system and an external antenna, designed for the M5Stack sets. M5Stack M031-C
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The case has openings for all outputs including the GPIO port making it a great fit for projects that are connected to external hardware.
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Development board with ST Zio and ST morpho connectors, based on the STM32H745ZI microcontroller. Thanks to the embedded STLINK-V3 programmer, it is possible to program and debug the microcontroller via USB. STMicroelectronics NUCLEO-H745ZI-Q
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Tadeusz Więckowski