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Test probe tip with 10X attenuation factor. Dedicated to Micsig probes from the SigOFIT series operating in the 100 MHz and 200 MHz frequency bands. Micsig OP10-2
Test probe tip with 20X attenuation factor. It allows to increase the measuring range and is dedicated to Micsig probes from the SigOFIT series operating in the 100 MHz and 200 MHz frequency bands.
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Insulated fiber optic probe with a measuring range up to 2500 V. It works in the band up to 100 MHz, it can be connected to the oscilloscope via the BNC connector. Comes with a 10X attenuation tip. MOIP100P
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Isolated optical-fiber probe Micsig MOIP200P Gen 3 designed for differential measurements in power electronics systems, SiC and GaN applications, and high-voltage environments. The probe operates with bandwidth up to 200 MHz and uses SigOFIT optical isolation technology providing high CMRR, low noise level, and galvanic isolation up to 85 kVpk. Supports interchangeable attenuator tips and works with oscilloscopes equipped with a 50 Ω BNC input. Micsig MOIP200P Gen 3
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The Zeenko 20 dB SMA attenuator is a solid and precise component for RF measurement paths, useful in diagnostics, calibration and protecting devices such as the tinySA, nanoVNA or RF generators. It enables safe measurements and improves impedance matching quality over a wide frequency range.
The Zeenko 30 dB SMA attenuator is a solid and precise component for RF measurement paths, useful in diagnostics, calibration and protecting devices such as the tinySA, nanoVNA or RF generators. It enables safe measurements and improves impedance matching quality over a wide frequency range.
The Zeenko N 10 dB attenuator is a reliable accessory for any RF system user – from amateurs to professionals. It enables safe and precise measurements and provides better signal matching in the signal path. Thanks to its high durability (up to 5 W), it is suitable for a wide range of laboratory and field applications.
This current probe is designed for measuring DC and AC current in power electronics systems and switching power supplies. It offers a 10 MHz DC bandwidth, a rise time of ≤ 46 ns, and two measurement ranges: 30 A and 150 A RMS, with a maximum peak current of up to 300 A. The device provides high measurement accuracy of ±1% and a resolution of up to 10 mA in the lower range. The BNC connector ensures compatibility with many oscilloscopes, and the 20 mm jaws enable current measurements in larger wires. Micsig CP1510
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This current probe is designed for measuring DC and AC current in power electronics systems and switching power supplies. It offers a 5 MHz DC bandwidth, a rise time of ≤ 70 ns, and two measurement ranges: 50 A and 300 A RMS, with a maximum peak current of up to 500 A. The device provides high measurement accuracy of ±1% and a resolution of up to 10 mA in the lower range. The BNC connector ensures compatibility with many oscilloscopes, and the 20 mm jaws enable current measurements in larger wires. Micsig CP3005
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Rogowski current probe designed for measuring high-amplitude AC currents up to 60 A, offering a wide bandwidth from 70 Hz to 30 MHz and a sensitivity of 100 mV/A. Its near-zero impedance enables accurate measurements without affecting the circuit under test, which is useful in analyzing fast waveforms and power systems (MOSFETs, IGBTs, SiC, GaN). Micsig RCP60XS-80
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Rogowski current probe designed for measuring high-amplitude AC currents up to 120 A, offering a wide bandwidth from 34 Hz to 30 MHz and a sensitivity of 50 mV/A. Its near-zero impedance enables accurate measurements without affecting the circuit under test, which is useful in analyzing fast waveforms and power systems (MOSFETs, IGBTs, SiC, GaN). Micsig RCP120XS-80
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Rogowski current probe designed for measuring high-amplitude AC currents up to 300 A, offering a wide bandwidth from 10 Hz to 30 MHz and a sensitivity of 20 mV/A. Its near-zero impedance enables accurate measurements without affecting the circuit under test, which is useful in analyzing fast waveforms and power systems (MOSFETs, IGBTs, SiC, GaN). Micsig RCP300XS-80
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Rogowski current probe designed for measuring high-amplitude AC currents up to 600 A, offering a wide bandwidth from 8 Hz to 30 MHz and a sensitivity of 10 mV/A. Its near-zero impedance enables accurate measurements without affecting the circuit under test, which is useful in analyzing fast waveforms and power systems (MOSFETs, IGBTs, SiC, GaN). Micsig RCP600XS-80
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Rogowski current probe designed for measuring high-amplitude AC currents up to 1200 A, offering a wide bandwidth from 5 Hz to 30 MHz and a sensitivity of 5 mV/A. Its near-zero impedance enables accurate measurements without affecting the circuit under test, which is useful in analyzing fast waveforms and power systems (MOSFETs, IGBTs, SiC, GaN). Micsig RCP1200XS-80
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Rogowski current probe designed for measuring high-amplitude AC currents up to 3000 A, offering a wide bandwidth from 4 Hz to 30 MHz and a sensitivity of 2 mV/A. Its near-zero impedance enables accurate measurements without affecting the circuit under test, which is useful in analyzing fast waveforms and power systems (MOSFETs, IGBTs, SiC, GaN). Micsig RCP3000XS-80
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Rogowski current probe designed for measuring high-amplitude AC currents up to 6000 A, offering a wide bandwidth from 4 Hz to 30 MHz and a sensitivity of 1 mV/A. Its near-zero impedance enables accurate measurements without affecting the circuit under test, which is useful in analyzing fast waveforms and power systems (MOSFETs, IGBTs, SiC, GaN). Micsig RCP6000XS-80
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Rogowski current probe designed for measuring high-amplitude AC currents up to 12,000 A, offering a wide bandwidth from 2 Hz to 30 MHz and a sensitivity of 0.5 mV/A. Its near-zero impedance enables accurate measurements without affecting the circuit under test, which is useful for analyzing fast waveforms and power systems (MOSFETs, IGBTs, SiC, GaN). Micsig RCP12000XS-80
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Rogowski current probe designed for measuring very high-amplitude AC currents up to 300 A, offering a wide bandwidth from 10 Hz to 20 MHz and a sensitivity of 20 mV/A. Its near-zero impedance enables accurate measurements without affecting the circuit under test, which is useful in analyzing fast waveforms and power systems (MOSFETs, IGBTs, SiC, GaN). Micsig RCP300XS-200
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Rogowski current probe designed for measuring very high-amplitude alternating currents up to 600 A, offering a wide bandwidth from 7 Hz to 20 MHz and a sensitivity of 10 mV/A. Its near-zero impedance enables accurate measurements without affecting the circuit under test, which is useful in analyzing fast waveforms and power systems (MOSFETs, IGBTs, SiC, GaN). Micsig RCP600XS-200
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Rogowski current probe designed for measuring very high-amplitude AC currents up to 1200 A, offering a wide bandwidth from 5 Hz to 20 MHz and a sensitivity of 2 mV/A. Its near-zero impedance enables accurate measurements without affecting the circuit under test, which is useful in analyzing fast waveforms and power systems (MOSFETs, IGBTs, SiC, GaN). Micsig RCP1200XS-200
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Test probe tip with 10X attenuation factor. Dedicated to Micsig probes from the SigOFIT series operating in the 100 MHz and 200 MHz frequency bands. Micsig OP10-2