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Isolated optical-fiber probe Micsig MOIP200P Gen 3 designed for differential measurements in power electronics systems, SiC and GaN applications, and high-voltage environments. The probe operates with bandwidth up to 200 MHz and uses SigOFIT optical isolation technology providing high CMRR, low noise level, and galvanic isolation up to 85 kVpk. Supports interchangeable attenuator tips and works with oscilloscopes equipped with a 50 Ω BNC input. Micsig MOIP200P Gen 3
Micsig MOIP200P Gen 3 optical-fiber isolated probe designed for fast differential measurements. The probe works with oscilloscopes equipped with a 50 Ω BNC input and the SigOFIT optical isolation system used in Micsig measurement equipment. The probe operates with bandwidth up to 200 MHz and supports floating measurements in environments with high electromagnetic interference levels.
The SigOFIT optical isolation technology provides extremely high common-mode rejection ratio (CMRR) reaching up to 180 dB at DC and 122 dB at 200 MHz. The design effectively suppresses oscillations and interference caused by high-frequency common-mode noise, enabling stable differential measurements in power electronics systems, inverters, converters, and applications based on SiC and GaN transistors.


The probe offers excellent amplitude-frequency characteristics with DC gain accuracy of 1%. Noise level has been reduced below 0.3 mVrms, enabling more accurate analysis of low-amplitude signals and fast signal edges. The Gen 3 version features automatic calibration and 0 dB / 20 dB gain switching for improved signal-to-noise ratio during measurements. The design uses optical-fiber signal transmission between O-E and E-O converters, providing galvanic isolation up to 85 kVpk.
The SigOFIT series supports interchangeable attenuator tips allowing adjustment of the measurement range to the tested application. Available attenuation ratios of 10X, 20X, 50X, 500X, 1000X, and 2000X enable measurements of both low-voltage and high-voltage power electronics systems. The MOIP200P Gen 3 is supplied with the OP50-3 attenuator tip supporting measurements up to ±25 V. The series also supports optional attenuator tips for ranges up to ±20 kV.

The probe is suitable for industrial applications, automotive electronics, power systems, EMI/ESD testing, inverters, converters, and development of systems based on SiC, GaN, and IGBT transistors. Optical signal isolation and low noise level enable floating measurements in environments with strong electromagnetic interference.
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Isolated optical-fiber probe Micsig MOIP200P Gen 3 designed for differential measurements in power electronics systems, SiC and GaN applications, and high-voltage environments. The probe operates with bandwidth up to 200 MHz and uses SigOFIT optical isolation technology providing high CMRR, low noise level, and galvanic isolation up to 85 kVpk. Supports interchangeable attenuator tips and works with oscilloscopes equipped with a 50 Ω BNC input. Micsig MOIP200P Gen 3