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Isolated optical-fiber probe Micsig MOIP350P Gen 3 designed for differential measurements in power electronics systems, SiC and GaN applications, and high-voltage environments. The probe operates with bandwidth up to 350 MHz and uses SigOFIT optical isolation technology providing high CMRR, low noise level, and galvanic isolation up to 85 kVpk. Supports interchangeable attenuator tips and works with oscilloscopes equipped with a 50 Ω BNC input. Micsig MOIP350P Gen 3
Micsig MOIP350P Gen 3 optical-fiber isolated probe designed for fast differential measurements. The probe works with oscilloscopes equipped with a 50 Ω BNC input and the SigOFIT optical isolation system used in Micsig measurement equipment. The probe operates with bandwidth up to 350 MHz and supports floating measurements in environments with high electromagnetic interference levels.
The SigOFIT optical isolation technology provides extremely high common-mode rejection ratio (CMRR) reaching up to 180 dB at DC and 118 dB at 350 MHz. The design effectively suppresses oscillations and interference caused by high-frequency common-mode noise, enabling stable differential measurements in power electronics systems, inverters, converters, and applications based on SiC and GaN transistors.


The probe offers excellent amplitude-frequency characteristics with DC gain accuracy of 1%. Noise level has been reduced below 0.3 mVrms, enabling more accurate analysis of low-amplitude signals and fast signal edges. The Gen 3 version features automatic calibration and 0 dB / 20 dB gain switching for improved signal-to-noise ratio during measurements. The design uses optical-fiber signal transmission between O-E and E-O converters, providing galvanic isolation up to 85 kVpk.
The SigOFIT series supports interchangeable attenuator tips allowing adjustment of the measurement range to the tested application. The MOIP350P Gen 3 is supplied with OP50 (MMCX) attenuator tips supporting measurements up to ±25 V and OP5000 (MCX) attenuator tips supporting measurements up to ±2500 V. Additional configurations and custom measurement ranges are also available.

The probe is suitable for industrial applications, automotive electronics, power systems, EMI/ESD testing, inverters, converters, and development of systems based on SiC, GaN, and IGBT transistors. Optical signal isolation and low noise level enable floating measurements in environments with strong electromagnetic interference.
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Test probe tip with 20X attenuation factor. Dedicated to Micsig probes from the SigOFIT series operating in the 350 MHz and 500 MHz frequency bands. Micsig OP20-5
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Test probe tip with 50X attenuation factor. Dedicated to Micsig probes from the SigOFIT series operating in the 350 MHz and 500 MHz frequency bands. Micsig OP50-5
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Test probe tip with 1000X attenuation factor. Dedicated to Micsig probes from the SigOFIT series operating in the 350 MHz and 500 MHz frequency bands. Micsig OP1000-5
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Test probe tip with 2000X attenuation factor. Dedicated to Micsig probes from the SigOFIT series operating in the 350 MHz and 500 MHz frequency bands. Micsig OP2000-5
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Isolated optical-fiber probe Micsig MOIP350P Gen 3 designed for differential measurements in power electronics systems, SiC and GaN applications, and high-voltage environments. The probe operates with bandwidth up to 350 MHz and uses SigOFIT optical isolation technology providing high CMRR, low noise level, and galvanic isolation up to 85 kVpk. Supports interchangeable attenuator tips and works with oscilloscopes equipped with a 50 Ω BNC input. Micsig MOIP350P Gen 3